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Don Dennison Appointed to Roll Out KIC’s Latest Thermal Analysis System Software in the Northeast

03/26/2024 | KIC
KIC, a renowned pioneer in thermal process and temperature measurement solutions for electronics manufacturing, is pleased to announce the appointment of PIT Equipment Services, LLC, led by Don Dennison, as its representative for New York, New Jersey, and Eastern Pennsylvania.

KIC to Discuss Revolutionary Contact-less Thermal AnalysisTM at SMTA Dallas Expo and Tech Forum

02/09/2024 | KIC
KIC, a renowned pioneer in thermal process and temperature measurement solutions for electronics manufacturing, will exhibit its latest breakthrough technology, Contact-less Thermal AnalysisTM, at the SMTA Dallas Expo and Tech Forum.

KIC’s Miles Moreau to Present Profiling Basics and Best Practices at SMTA Wisconsin Chapter PCBA Profile Workshop

01/25/2024 | KIC
KIC, a renowned pioneer in thermal process and temperature measurement solutions for electronics manufacturing, announces that Miles Moreau, General Manager, will be a featured speaker at the SMTA Wisconsin Chapter In-Person PCBA Profile Workshop.

Real Time with... productronica 2023: KIC Introduces Proprietary New Technology

11/22/2023 | Real Time with...Productronica
KIC’s proprietary new embedded barometer enables real-time detection of temperature change, board jams, and more. Miles Moreau details features that lead to reduced changeover time and improved manufacturing efficiency.

KIC’s Miles Moreau to Present Groundbreaking Sensing Technology at productronica

11/10/2023 | KIC
KIC, a renowned pioneer in thermal process and temperature measurement solutions for electronics manufacturing, is thrilled to announce an unprecedented leap in reflow process inspection (RPI) technology. General Manager Miles Moreau will be presenting an exclusive lecture at productronica on Wednesday, November 15, 2023, at the productronica Forum, unveiling the remarkable “Real-time production reflow profile inspection, with new sensor technology for heat transfer detection.”
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