Goepel electronic and SYSTECH Develop JTAG/Boundary Scan for Takaya FPT


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Goepel electronic and SYSTECH Europe have developed a JTAG/boundary scan integration for the APT-1400F Takaya flying probe testers (FPT). The solution is based on complete integration of the boundary scan hardware SCANFLEX and the software SYSTEM CASCON. A cost-effective and time-efficient platform for testing electrical assemblies during production is therefore offered in combination with the flying probe tester from Takaya.

This cooperation is not just a matter of executing the two test methods within a single testing station. Rather, the intention is that the two systems benefit from one another as a result of extensive interaction, providing users with considerable added value in quality terms for the entire testing strategy. For example, the mobile probes in the Boundary Scan Test can be used to incorporate additional test points. This results in greater testing depth and more detailed diagnosis. The dovetailing between the software of the two systems ensures that both test methods can be managed in a combined test plan, generating a combined test report.

Takaya_Goepel.jpg

Boris Opfer (left) and Alexander Beck (right) implement the integration of boundary scan in the flying probe test system APT-1400F.

"Goepel electronic has already enjoyed many years of cooperation with Takaya, manufacturer of the world's first flying probe test system," says Boris Opfer, product manager in ICT sales and technical services at SYSTECH Europe. "We are able to draw on more than 30 years of expertise, with more than 2,000 systems installed. With Goepel electronic working alongside us as boundary scan pioneers, together we offer customers a low-cost, sustainable testing strategy."

The hardware package required for the integration consists of a PCIe boundary scan controller, a TAP transceiver and also an I/O module, which is connected to the mobile probes by means of a preconfigured plug. This structure can be integrated seamlessly into existing systems.

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