Reading time ( words)
Industry-leading associations IPC and SMTA jointly announce the High-Reliability Cleaning and Conformal Coating Conference, scheduled to take place November 13-15, 2018 at Chicago Marriott, Schaumburg, Illinois. The conference is focused on the cleanliness of highly dense electronic assemblies to achieve quality and reliability within the stated in-field environment.
For many years, military (e.g. MIL-STD-2000) and commercial (e.g. IPC-J-STD-001) manufacturing standards required manufactured circuit card assemblies (CCAs) to meet and ionic cleanliness requirement of 1.56 microgram (µg) of sodium chloride (NaCl) equivalence per square centimeter (cm2) of extracted surface, using Resistivity of Solvent Extract (ROSE) testing per IPC-TM-650, method 2.3.25. The flux chemistries and cleaning solutions used today are entirely different from those used with the ROSE limits were established.
There is mounting evidence that as the circuit card assembly component density increases, so does the sensitivity of the circuit to ionic contamination. New test methods are needed to predict acceptable levels of ionic residues adequately.
This conference addresses these global changes in ionic cleanliness requirements.
Come learn about these valuable lessons and more at the IPC/SMTA Cleaning and Conformal Coating Conference.
For more information, click here.