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Zero Defects International (ZDI) has announced their participation as an exhibitor at the SMTA Silicon Valley Expo and Tech Forum.
It will be held at the Bestronics Box Build manufacturing facility in San Jose located at 2243 Lundy Avenue, San Jose. The date of this exhibition is Wednesday, November 28. Expo hours are 10:00 a.m. until 3:00 p.m. with a 12:00 luncheon and a 3:00 p.m. reception.
Foremost among the PCB and PCBA test and inspection services and products to be shown will be ZDI's ICT flying-probe test services along with their reverse engineering and failure analysis capabilities. Similarly, ZDI will also feature test and inspection equipment including ICT and flying-probe test systems from Seica. ZDI personnel in attendance include Michaela Brody (president), Berto Miranda (operations manager), Phuong Luu (senior test engineer) and Paul Benke (CEO).
Other ZDI partner's products to be shown are Viscom, who will also exhibit and will have Barbara Koczera attending, as well as Europlacer, Skyla, Landrex, Tagarno and Epoch International.
Jens Kokott and Matthias Muller, Goepel electronic
Production runs of 10–1,000 assemblies are everyday life for an EMS provider. But what if important staff are on vacation, and component deliveries are very much delayed? And then the customer is determined to have AOI, but the layout of the assembly is highly customized, making it virtually impossible to use complete library entries. Here's how AOI programs can help you in these scenarios.
Jason Fullerton, Alpha Assembly Solutions
This paper investigates and compares the performance of no-clean liquid wave soldering fluxes using a commercially available localized extraction and cleanliness testing system, and surface insulation resistance (SIR) testing. Find out which test is suitable for your processes.
Joe Russeau, Precision Analytical Laboratory, and Mark Northrup, IEC Electronics
Industry experts are saying that Resistivity of Solvent Extract (ROSE) testing should be retired as a cleanliness or process control test in the PCB assembly industry. This article emphasizes that position by highlighting some work by the authors comparing component cleanliness results from the ROSE against Ion Chromatography (IC) results.