Real Time with... SMTAI 2019 Video Interviews


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The SMTA International Conference and Exhibition 2019, which took place September 22–26, 2019, at the Donald E. Stephens Convention Center in Rosemont, Illinois, concluded successfully. For those of you who were not able to make it to the show, catch our video interviews with the movers and shakers of the electronics industry. We've updated our video presentation for a better experience for our users, so check it out!

Below is the list of Real Time with… SMTAI 2019 video interviews at the show. Also, visit Real Time with... SMTAI 2019 to view our expansive photo gallery of images captured throughout the exhibition floor.

  1. EPTAC Continues Its Expansion
  2. Gary Tanel Provides an SMTA Update
  3. Michael Ford on IPC-CFX and the Effects of Industry 4.0
  4. SMTAI 2019 Technical Sessions Overview and 2020 Preview
  5. Lenora Clark Discusses Company Changes and Her New Role
  6. Juan Arango Discusses Koh Young America's New Headquarters
  7. SMTAI 2019: Nir Benson Discusses Mentor's Challenges and Solutions
  8. Company Updates and Future J-STD-001 Changes
  9. Creative Electron's Mobile X-ray Van and LED-specialized Equipment
  10. Chris Bastecki on Low-temperature Solder Challenges and Products
  11. KIC's New, Smart Factory Products
  12. Tom Forsythe on Cleaning Challenges and Solutions
  13. MIRTEC's Newest Product Introduced at SMTAI
  14. Kristen Mattson on the SMTAI Vacuum Reflow Systems Demo
  15. Carmichael Gugliotti Discusses His First SMTAI Paper
  16. SAFI-Tech's No-heat SAC305: A Possible Gamechanger
  17. George Milad's SMTAI Paper and the IPC ENIG Specification Revision

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SMTAI 2019: Michael Ford on IPC-CFX and the Effects of Industry 4.0

10/09/2019 | Real Time with...SMTAI
Michael Ford, senior director of emerging industry strategy at Aegis Software, and Nolan Johnson discuss some of the long-term, global effects of Industry 4.0 and life beyond IPC-CFX.

The Long Road to a New Standard

09/17/2019 | Barry Matties, I-Connect007
Graham Naisbitt, chairman and CEO of Gen3 Systems, has spent decades leading cleanliness testing standards in a number of different standards organizations like IPC, IEC, and ISO around an assortment of testing methods, such as CAF, SIR, and even introducing a new standard this year for his own testing method—process ionic contamination testing (PICT). Naisbitt breaks down his long involvement with standards and where they stand currently.

eSMART Factory Conference 2019, Day 1

09/02/2019 | Happy Holden, I-Connect007
The recent eSMART Factory Conference in June in Dearborn, Michigan, was the second annual conference on the smart factory. SMTA described it as "A technical conference with a focus on electronics manufacturing from software systems/processes to augmented reality and smart inspection." In this article, Happy Holden gives us the highlights of the conference.



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