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Waygate Technologies (formerly GE Inspection Technologies), a world leader in industrial inspection solutions, has launched the next generation of its versatile industrial 2D radiography and 3D CT system Phoenix V|tome|x S240. While maintaining its industry-proven, optional combination of both a nanofocus and microfocus X-ray tube, the new system is equipped with the Dynamic 41|200p+ detector technology that allows for higher resolution and image quality at much faster scan times. The revised, more spacious cabin design further increases efficiency of use with easy sample loading and servicing. The new features are designed to make quality control and production processes more efficient and ensure safety, quality, and productivity for customers. The next generation V|tome|x S240 covers a wide range of CT applications in research institutes and industrial quality labs, including internal defect analysis, 3D quantitative porosity analysis, materials structure analysis, assembly control, and coordinate measurement tasks such as CAD data nom/act comparison.
The bestselling industrial CT workhorse
When it was launched in 2003, the initial Phoenix V|tome|x S was the first lab size highly resolving micro- and nanofocus CT system. With its unique Dual|tube configuration option and the included 2D X-ray inspection capability, the compact model rapidly became the bestselling CT system of its kind with now approximately 500 installations all over the world.
Improved detector performance, more speed and tube flexibility
The main update for the new V|tome|x S240 is the next generation 16” Dynamic 41|200p+ digital detector. The proprietary device is well established with the premium system V|tome|x M. It doubles CT throughput at the same quality level as conventional DXR detectors by combining increased detector sensitivity and a larger imaging area with faster frame rates and adaptive imaging modes.
By concentrating more power on a smaller focal spot, the optional High-flux|target offered by Waygate Technologies doubles resolution or scan speed. Production throughput can thus be increased even further without compromising on accuracy and precision.
With its proven Dual|tube technology the V|tome|x S240 can automatically switch between a 180 kV/20 W high-power nanofocus X-ray tube and a 240 kV/320 W microfocus X-ray tube within a few minutes. This range allows the system to cover inspection challenges in the electronics and automotive industries as well as R&D and scientific applications from extreme high-resolution nanoCT scans of low absorbing materials with a detail detectability of up to 200 nanometers to 3D microCT analysis of high absorbing objects up to 400 mm in diameter.
The CT system also comes standard with an additional tilt axis, also enabling flexible 2D X-ray inspection.
Scanning longer parts faster and measuring complex parts with accuracy
The Phoenix V|tome|x S240 is capable of helical (or spiral) scanning with the sample moving upwards in the X-ray beam, thereby enabling faster scans of longer parts, and eliminating the need to stitch several partial scan results together afterwards. This acquisition technique also generates significantly better results by eliminating artifacts on horizontal surfaces and in the stitching areas. With its new Offset|CT scan capability, the system can also scan bigger parts than ever before, or the same size parts with higher resolution.
Automated scanning, data acquisition and processing
The Phoenix V|tome|x S240 is equipped with an advanced, highly intuitive CT scanning software for fully automated data acquisition and volume processing. In production mode, the entire CT scanning and evaluation process chain can be initiated with the press of a button and 3D failure analysis or 3D metrology tasks will be executed automatically.