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Joel Scutchfield of Koh Young America and SMT007 Editor Nolon Johnson discuss the smart factory's need for a total inspection solution that includes SPI, AOI, DPI, API, and KSMART, along with multi-point inspection (SPI, pre, and post) to improve yields. As Scutchfield points out, "Connectivity alone does not equal a smart factory. It's what you do with the data."
If you were unable to attend IPC APEX EXPO, don't worry. We're bringing you coverage of the week's events in San Diego, from ribbon cutting to teardown.
Check out this additional content from Koh Young:
- The Printed Circuit Assembler’s Guide to… SMT Inspection: Today, Tomorrow, and Beyond by Brent Fischthal (a free eBook available for download)
- “Converting Process Data Into Intelligence” by Joel Scutchfield and Ivan Aduna, a free 12-part micro webinar series
- You can also view other titles in our full I-007e Book library here