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Test Research, Inc. (TRI) announces the launch of the 3D high-speed bottom-view AOI solution, TR7700QB SII, performing at industry-leading speeds of up to 57 cm2/sec.
The TR7700QB SII is built on an enhanced mechanical platform to guarantee stability, accuracy, and precision during the inspection. The TR7700QB SII is the bottom-view 3D AOI solution with 15 µm high resolution 12 MP imaging capable of metrology-grade inspection.
Designed for high-coverage bottom-view inspection, the TR7700QB SII offers defect detection for Through-hole technology (THT) components and dual in-line packages. The smart-factory-ready solution is capable of data exchange and eases MES connectivity.
Andy Shaughnessy, I-Connect007
At the SMTA Dallas Expo, Andy Shaughnessy sat down with Miles Moreau of KIC to discuss the company’s latest offering in wave process inspection technology. Miles also explains how KIC’s early focus on automated real-time process monitoring has enabled them to become a leader in Smart factory implementation.
Brent Fischthal, Koh Young America
Today, optical inspection systems are the preferred solution for in-line quality control in the SMT industry. Systems such as solder paste inspection (SPI) or automated optical inspection (AOI) systems for pre- and post-reflow are almost standard in every production facility.
Real Time with...IPC
Guest Editor Michael Ford and Gustavo Jimenez, Koh Young's sales manager for Northern Mexico, discuss some of the company's newest technologies, including True3D™ technology for pin inspection, which has proven popular with the automotive segment.