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Best Papers from IPC APEX EXPO 2010
April 12, 2010 |Estimated reading time: 2 minutes
BANNOCKBURN, IL — IPC – Association Connecting Electronics Industries announced the winners of the 2010 Best U.S. and International Papers at IPC APEX EXPO, held last week in Las Vegas. Papers covered challenging rework, drop test on lead-free PCBs, embedded components, and head-in-pillow defects.
The event’s Technical Program Committee selected the winners through a ballot process.
“Copper Tin Intermetallic Crystals and Their Role in the Formation of Microbridges between the Leads of Hand Reworked Fine-Pitch Components,” by Jeffrey Kukelhan, BAE Systems Electronics, Intelligence & Support, took the U.S. Best Paper honor.
Two International Best Papers tied for first place honors. Polina Snugovsky, Ph.D., and Jason Bragg of Celestica International Inc. won for “Drop Test Performance of a Medium Complexity Lead-free Board after Assembly and Rework.” Coauthors were: Russell Brush, Eva Kosiba, Billy Lee, Marianne Romansky, Suthakaran Subramaniam and Michel Thomson, all from Celestica International Inc.; Andrew Ganster, Crane Division NSWC; William Russell, Raytheon; Dennis Fritz, SAIC; and Carol Handwerker, Sc.D., and Jonathan Tucker from Purdue University.
The other winning International Paper award went to Arnaud Grivon of Thales Corporate Services, for authoring “Industrial PCB Development Using Embedded Passive & Active Discrete Chips Focused on Process and DfR.” His co-authors were Michel Brizoux, Dr. W.C. Maia Filho and E. Monier-Vinard, all from Thales Corporate Services, along with Johannes Stahr and Mike Morianz of AT&S Austria Technologie Systemtechnik AG.
Russell Nowland, Alcatel-Lucent, was presented the U.S. Honorable Mention award for “Telecommunication Case Studies Address Head-in-pillow (HnP) Defects and Mitigation through Assembly Process Modifications and Control.” Richard Coyle and Peter Read, both from Alcatel-Lucent, and George Wenger, from the Andrew Division of Commscope, co-authored the prize-winning paper with Nowland.
Nearly 100 papers were submitted for consideration as Best Paper. Papers were evaluated on their technical content, originality, test procedures and data used to deduce conclusions, quality of illustrations and the clarity and professionalism of writing.
Copies of the winning papers are included in the 2010 Technical Conference Proceedings. The Proceedings CD will be available for purchase through the IPC Online Store at www.ipc.org. All winning papers will be published in IPC Review, a bimonthly publication distributed exclusively to IPC members. Members may also access the winning papers in the Members-Only section of the IPC Website, www.ipc.org.
See More APEX News:Jack Bramel Receives IPC Raymond E. Pritchard Hall of Fame Award Bob Black of Juki Honored with IPC President Award DuPont and Raytheon Honored with 2010 IPC Corporate Recognition Awards at IPC APEX EXPOSMT Celebrates 18th Annual SMT VISION Awards with Top Industry ProductsSMT Names Morey Corp. VP 1st SMT VISIONARY Winner
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