New Test and Inspection Products


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JTAG Technologies released JTAG Live; Surface Mount Technology Corp debuted the SMART platform; Pickering Interfaces introduced RF Matrix LXI switches; Vi TECHNOLOGY upgraded its inspection offerings; Marantz entered solder paste inspection (SPI); and ASSET debuted IC test.PCB Design Debug with JTAG

JTAG Live suits electronics engineers and technicians checking PCBs for basic continuity and correct operation. The JTAG Live family comprises Buzz, Clip, and Script, each targeted at different aspects of the debugging process. Buzz provides the ability to quickly check direct and indirect connections between devices that support boundary-scan. Clip offers ways to verify cluster logic using vector-based cluster tests. Script enables users to adopt a functional, device-oriented test approach to take control of a design through on-board JTAG/boundary-scan compliant devices. To support easy access and quick start-up, Buzz is available free of charge from the JTAG Live website. Clip and Script are downloads available for a nominal charge. JTAG Live capitalizes on the boundary-scan circuitry found on high-end circuit boards. There is no need for a netlist; the tools use device BSDL files, available from the IC vendors, to identify inputs and outputs for driving and sensing. Users are able to define up to two boundary-scan chains and quickly verify chain integrity. The Watch window in Buzz shows the current logic state (hi-low or toggling) of any selected boundary-scan pin. Buzz also gives hardware design engineers a practical way to check continuity between two pins on a prototype board, mimicking the familiar DMM buzz measurement but without probes. Within the Measure window of Buzz, a user selects a pin to be driven, sets it high or low, and reads the resulting value on the sense pin. Buzz also shows multi-pin nets, allowing users to drive from one pin to many to check for correct fan-out connectivity or from multiple pins to one or more sense pins to perform a test on bus lines or to verify a simple cluster of one or more logic gates. Clip allows engineers to debug more complex clusters using vector-based cluster test sequences. Each vector in a sequence contains a set of input values for device or cluster inputs and a set of expected cluster output values. The Clip user interface offers a logic analyzer / pattern generator-style state and timing display mode for defining vectors and observing test results. Tests created within Clip can be saved and recalled for testing multiple boards of the same type. Script provides a powerful API to manipulate and sense cluster I/Os. Script offers a functional, device-oriented test approach for mixed-signal device testing, operations that require user intervention, and test pattern looping for setting up device registers. Within Script, users employ the open-source programming language Python to check interconnects and verify operation of non-boundary-scan clusters. Through high-level routines embedded in a Python program, Script drives and senses values on pins or groups of pins. The built-in Python editor facilitates preparation of the sequences to perform tests and collect results. To connect to the board, JTAG Live is fully compatible with the popular JTAG programming cables from Altera and Xilinx, as well as with the two-port USB Explorer from JTAG Technologies. JTAG Technologies, www.jtaglive.com.

Low-cost Test

The S.M.A.R.T. Platform, Scalable Modular Automated Re-usable Test, offers a test solution for low- to mid-volume PCB assemblies without high tooling costs. As a contract manufacturer of complex electronic assemblies for markets that require high quality and reliability, Surface Mount Technology Corp. created this test alternative to provide customers a solution for test at a lower price point. Since automated test equipment (ATE) fixtures are typically custom to each assembly they often do not hit a price point that fits for lower-volume boards. The SMART platform consists of a set of commercial off-the-shelf (COTS) USB-based instrumentation as well as standard software drivers. To develop a test for any assembly, a low-cost fixture is developed from a standard fixture kit that interfaces to the SMART platform through a standard set of connectors. The fixture provides probing to the unit under test and connectivity to the instruments in the SMART Platform. A test program is created using software libraries that provide an efficient test development environment. The libraries have support for standard tests, user interface development, report generation, troubleshooting and fixture maintenance, and interfacing to data collection facilities for statistical process control. Surface Mount Technology Corp. can provide a duplicate test fixture and SMART platform to the customer. Surface Mount Technology Corp., www.teamsmt.com

LXI RF Switches

The 60-730 and 60-770 RF Matrices are designed for switching signals to frequencies up to 2.5 GHz. The 60-770 is a 50 ? RF Matrix available in 32x8, 24x8, 16x8 and 8x8 configurations contained within a compact 3U rack mountable case. Front panel connectors are SMA. The 60-730 is a 75 ? RF matrix available in 32x16, 16x16, 16x8 and 8x8 configurations contained within a 6U rack mountable case. Front panel connectors are F Type, allowing the LXI device to be used in typical coaxial video applications. The RF Devices can be constructed in various configurations for specific user requests. The construction method ensures the matrices offer excellent crosstalk and isolation characteristics and provide a cost-effective solution for the complex routing of RF signals in test systems. The products all use high-reliability EMR relays and can be offered in other configurations and connector styles to meet individual user needs. Internal construction is virtually cable-free. Pickering Interfaces, www.pickeringtest.com

Inspection Upgrades

Inspection speed improvement, lower false call and escape rate, improved SW and HW functionality, such as Selective 3D and the Kaleido acquisition head, help reduce the cost of ownership. The Selective 3D AOI technology provides accurate tilt and coplanarity measurement of ICs, connectors, and passive components. The Kaleido color view provides an enhanced color picture at the defect viewer station. The 7K Series multi-segment dual-lane conveyor has large board capabilities up to 21 × 11″ for each of the two lanes. The 5K Series uses the latest software integrated suite enhancing ease of use programming and defect capture. Service and Support offerings were reorganized to better reflect the company’s expertise and capabilities: Product evaluation with an innovative Try & Share program to evaluate products at no cost and measure real benefits. Training with standard or customized, technical training and hands-on practice sessions. Programming services for best performance of the AOI and fast turn-around time. Ramp-up assistance for immediate benefits and cost savings. Turnkey maintenance contracts for peace of mind and longer investment protection. Hardware and software audits, yield enhancement best practices and experts recommendations for continuous improvements and added value. Vi TECHNOLOGY, http://www.vitechnology.com/

Solder Paste Inspection

Marantz Business Electronics has announced the signing of an OEM agreement with DJTECH of Japan encompassing solder paste inspection technologies and equipment developed to Marantz specifications. Marantz Business Electronics engaged with DJTECH in the field of solder paste inspection technology to provide exclusive designs now incorporated within the PowerSpector range of Marantz AOI machines. The Marantz PowerSpector S1 includes patented new sensor technology and will integrate with Marantz’ SPC software tools and technical on-line support systems. Its 5D imaging (3D and 2D) delivers true area, shape, offset, volume and height measurement together. The SPI system also offers fast set up times and low false calls. Marantz Business Electronics, Marantz Europe, www.marantz.com/bus/eu

IC Test Tool

ASSET will integrate its first IC test tool into the ScanWorks platform for embedded instrumentation and resell SiliconAid’s insertion and verification tools that support the emerging IEEE P1687 Internal JTAG (IJTAG) standard. SiliconAid is a supplier of world class chip verification and debug tools that support the IEEE 1149.1 Boundary-Scan Standard. Beyond this chip debugger integrated into the ScanWorks platform, the company plans for extensive chip tests that can be re-used in board and system test. SiliconAid’s JTD chip debugger, which will be integrated into ScanWorks immediately, is a robust real-time test and debug tool that can monitor structures inside chips and give visibility through an intuitive graphical interface to the engineer who is debugging the device. Although ASSET will initially resell SiliconAid’s IEEE P1687 IJTAG synthesis (JTS) and verification (JTV) tools, future plans could call for these tools to be integrated into ScanWorks as well. JTS and JTV allow chip designers to automatically insert IJTAG capabilities into chips and subsequently verify the implementation. The SiliconAid JTAG Environment (SAJE SM) is comprised of tools (JTV TM, JTS TM, JTD TM) that focus on chip level JTAG needs for 1149.1, 1149.6, and now IEEE P1687. SAJE SM can be integrated into any major chip design process to handle JTAG requirements. The SAJE SM suite performs semantic checking, simulation-based verification, automatic test program generation (ATPG) and interactive debugging. Now the SAJE SM suite offers these functions in support of the IEEE P1687 standard. SAJESM can leverage design simulation information into automatic test equipment (ATE) and board test with test patterns and an interactive debugger (JTD TM). ASSET InterTech, www.asset-intertech.com and SiliconAid Solutions, Inc., www.siliconaid.com

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