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New JTAG, ICT, Cleanliness, and Other Test Products
August 11, 2009 |Estimated reading time: 8 minutes
Following are the new products in boundary scan, functional test, ionic contamination, flying probe, combination systems, and other diagnostics and test equipment for the electronics industry.
Flying Probe TestThe S280 is a horizontal flying probe test system designed for testing any type of printed circuit board (PCB) from simple single-side circuits to complex multi-layers, inner-layers, and ceramics. The system uses eight independent mobile probes, four probes on each board side. The S280 can carry all eight probes on the same pad (four on each side). A pass-through conveyor and multi-type-board-handler (MBTH) enable operator-free operation. Up to 100 different PCBs can be loaded and tested automatically. A third-generation linear guide provides high speed, accuracy, and measurement repeatability. The X and Y axes use roller bearings and brushless motors coupled with pre-loaded, high-precision ball screws to move the eight measurement probes. The Z axes integrate ultra-compact linear motors for high-speed performance and touchdown control. The pneumatic board handler automatically stretches large panels and thin PCBs, and has motorized width adjustment that automatically moves the fixture to the programmed position. Its probe design and independent test head movement allows both Kelvin Test and Barrel Tests without changing probes. It is also possible to test any type of embedded component; with the relative options enabled, the Viva software will automatically generate the Kelvin test, Barrel test, and ICT for these types of components. The high level of programmability and run-time control of the Z-axes allow the user to program the speed and pressure of every test probe, leaving virtually no witness marks on the PCB. Users can "autolearn" the non-planarity of the board under test, and an X/Y/Z retry can be implemented to immediately verify any fault found. Five profiles are available at the operator level to manage automatically all kinds of PCB surfaces. The standard configuration S280 comes with two CCD cameras, one for each side of the PCB. The cameras can be used for fiducial recognition, verification/modification of test points, optical inspection, live probes view, and learning test points for unknown PCBs to recreate the netlist. The S280 is based on the Seica VIP platform with VIVA software. The integrated "Test Wizard" guides the operator through the steps needed to create a new test program in a matter of minutes starting from the PCB data. Periodic calibration of the test probes is simple and fast using the interactive procedure integrated in the software and the dedicated card supplied with the system, and the VIVA software also provides a complete, interactive set of autodiagnostic tools to monitor, in real time, the operating status of the system. Remote service is available for technical support. Seica S.p.A., www.seica.com.
1st-level Functional Test SystemThe portable Break Out Box PTE-100, designed for 1st-level functional test (FT) has strong stimuli/measurement capabilities. Based on Seica's standard VIP architecture, including the DSP ACL module, the PTE-100 combines the features of different instruments like voltage generator, current generator, waveform generator, voltmeter, amperometer, frequency meter, and oscilloscope, with the typical features of an automatic test system. It is also equipped with a mid-range power relay matrix (500V @2A) with switching and interrupt functions of up to 256 I/O channels. The PTE-100 suits diagnosing and identifying field faults in the electronic systems aboard helicopters, trains, planes, and systems made up of electronic modules interconnected through cables equipped with break-out connectors. The PTE-100 is connected between two modules to monitor the activity present on the interconnect cable, and can execute stimuli/measurement operations as well as simply connect/interrupt every single wire of the cable itself to facilitate diagnosis. The numerous integrated hardware functions and its fully "general purpose" architecture make the PTE-100 a replacement for many different break out boxes dedicated to specific applications, decreasing the weight and volume of maintenance equipment. Seica "Quick Test" software provides a graphical, easy to use interface. PTE-100 can be used in the manual mode typical of a lab instrument or in an automatic "ATE" mode, executing previously stored test sequences. Seica S.p.A.
Parallel PCB TestThe new Dispatcher for ASSET InterTech's ScanWorks platform for embedded instrumentation manages the application of tests and diagnostics to an unlimited number of PCBs in parallel. In addition, the circuit boards being tested can be local to the ScanWorks platform or remote. Dispatcher for the ScanWorks platform is particularly cost-effective in high-volume manufacturing operations or where multiple circuit boards are being tested in an environmental chamber. Testing many circuit boards simultaneously or in parallel from one test station can reduce the number of testers needed. Dispatcher works in conjunction with ScanWorks' Remote Instrumentation Controller Model 1000 (RIC-1000), a self-contained intelligent controller that connects a local or remote unit under test (UUT) to the ScanWorks platform over an Ethernet or Internet connection and applies tests or diagnostics on the UUT. For Dispatcher to manage the test and diagnostic process on multiple UUTs, each UUT must be connected to an RIC-1000. Dispatcher also simplifies the tracking of test results from multiple circuit boards. Test results are formatted as XML files to ease data retrieval and processing. Dispatcher comes with an application programming interface (API) that simplifies customization of the user interface or integration into a test environment such as National Instruments' LabVIEW or TestStand. Initially, Dispatcher will support boundary scan test and in-system programming. Support for other embedded instrumentation test technologies will be available soon. ASSET InterTech, www.asset-intertech.com.
Combination of JTAG/Boundary Scan and Optical InspectionA cost-effective hybrid, this system performs simple optical inspection tasks of LEDs, displays or OCR executed by the TOM (Teachable Optical Measurement) system, while Boundary Scan controls the board. In addition to the high test coverage, the advantage of this combination is the automation of tradition manual visual inspection, e.g. LEDs and displays verification. By omitting an operator the test speed significantly increases and removes human error. Characteristics can be evaluated that are not visible to the naked eye (brightness, contrast). The combination of electric and optical tests enables detection of critical faults in hidden areas, e.g. shorts or open pins. A camera is installed above the board under test for optical inspection. The test results are analyzed by the TOM software and sent to the JTAG/Boundary Scan software suite SYSTEM CASCON. Because both software programs are compatible all test results of the Boundary Scan and optical inspection are displayed in SYSTEM CASCON in one window or monitor. Using JTAG/Boundary Scan, test, programming, verification, debug and emulation tasks can be executed. SYSTEM CASCON is a professional JTAG/Boundary Scan development environment with currently 40 completely integrated ISP, test, and debug tools, supporting IEEE1149.1, IEEE1149.4, IEEE1149.6, IEEE1532, and JESD71 as well as mixed signal operations and VarioTAP for emulation test. GÖPEL electronic GmbH, www.goepel.com.
ACE's GEN3 ionic contamination tester.Ionic Contamination Test ServiceACE Production Technologies Inc. added a CM-60 ionic contamination (IC) tester (cleanliness test) to the company's Selective Soldering Process Development Lab. ACE selected GEN3 Systems CM-60 ionic test balance technology for its automated features, such as the CM-Series Volumetric Measurement cell that automatically calculates surface area to be tested. An essential part of the selective soldering process development is that all of the various components being processed, as well as the results, are of acceptable quality and that they will contribute to product reliability. ACE added the IC tester to its customer service lab because cleanliness is one of the fundamental requirements of a consistent process. The GEN3 Systems CM-60 is capable of testing in accordance with IPC/ANSI-J-STD001D and UK DEF-STD and other international specifications. The process lab is equipped with all of ACE's selective soldering tools, including traveling mini-wave systems, advanced solder fountains, spray and drop-jet fluxing systems, the LTS 200 lead tinning system and a nitrogen generator. ACE Production Technologies, www.ace-protech.com.
Automatic JTAG Program GeneratorDesigned for dynamic test of on-board system bus structures in the context of the boundary scan software platform SYSTEM CASCON, the program generation tools are based on the VarioTAP technology for functional emulation tests. They enable complete automation of test vector generation and the error diagnostics. An Automatic VarioTAP test program generator (AVTG) for bus devices is integrated in SYSTEM CASCON, using the same project database as the existing boundary scan modules. The AVTG recognizes the structural relations between the processor and the connected bus components and generates structural test vectors, which are later attached as emulation tests in real time to the target. In simple terms, it enables the dynamic test of resources connected to the processor, such as communication interfaces, CTC, bus bridge, digital I/O, analog I/O, displays, etc., with deterministic fault coverage. It complements VarioTAP tools for testing dynamic/static storage and programming embedded and external flash. The AVTG accesses extensive circuit libraries, as well as VarioTAP® models of the target processor. VarioTAP models are modular IP and include all functions for handling a processor for emulation tests or flash programming. Test program generation is based on CASLAN (native CASCON language) source code. Programs are compatible with all GOEPEL electronic ScanBooster and SCANFLEX JTAG/Boundary Scan controllers. GÖEPEL electronic.
Universal Boundary Scan TesterJULIET (JTAG UnLimItEd Tester) is a family of integrated, stand-alone production testers. The modular systems combine all test electronics, as well as the basic mechanics in a compact desktop system. A specific interface to an exchangeable adaptor gives fast changes to accommodate different units under test (UUT). The desktop systems are available in JULIET-Base (120 I/O channels, 2 TAPs, 16 MHz scan performance) and JULIET-Standard (240 I/O channels, 4 TAPs, 50 MHz scan performance). All JULIET systems provide 4 independently programmable UUT voltages including current measurement for 2 and 4 registers for covering gang-applications, and an effective adaptation area of 310 × 210 mm. An integrated exchangeable-adaptor appliance with type recognition allows standard UUT adaptations over needle contacts or real connectors with simultaneous access to all interface signals even in the active state. This facilitates selective monitoring of critical signals and makes debugging more effective. All JULIET systems allow the execution of boundary scan tests, in-system-programming (ISP) of flash and PLD, functional emulation tests, MCU programming, and interface tests, with the active process shown on an integrated display. An external USB- or LAN-connected PC or laptop controls testing. Systems come with standard versions of the JTAG/Boundary Scan program package SYSTEM CASCON. JULIET-Standard is based on the SCANFLEX architecture, while JULIET-Base is based on the low-cost ScanBooster architecture. Both JULIET versions are available in the configurations Run Time Station (RTS), Failure Diagnostics Station (FDS), and Repair/Debug Station (RDS). The latter provides all ScanAssist Debug-Tools, as well as ScanVision for graphical visualization of detected faults. GÖEPEL electronic.