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Craig Hillman to Present on Reliability
January 8, 2007 |Estimated reading time: Less than a minute
COLLEGE PARK, Md. Craig Hillman, Ph.D., will be special guest speaker at the North American Regulatory Conference for Electronics Products, January 23 24, in Shenzhen, China. Hillman, CEO and managing partner of DfR Solutions (College Park, Md.), will cover failure analysis for electronics and risk minimization for lead-free design in telecom applications.
With a BS in metallurgical engineering, materials, engineering, and public policy from Carnegie Mellon; masters in material science from the University of California Santa Barbara; and a research fellowship from Cambridge University (U.K.), Hillman has published more than 40 papers on electronics quality and reliability. He has also performed more than 500 failure-analysis investigations.
For more information on the conference presented by MET Labs, see our Events page.