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DEK Extends Quality Control Partnership
November 6, 2006 |Estimated reading time: Less than a minute
FLEMINGTON, N.J. Having completed a solder paste inspection development project, DEK announced it will continue collaborating with vision systems partners for quality control projects.
Orbotech, CyberOptics, and Koh Young worked with DEK to integrate paste-printer event data with post-print inspection and statistical process control (SPC) reports. The companies plan to improve problem-recognition in real-time manufacturing by combining the process data metrics. The collaborating companies plan to further research with other technologies.