Test System Highlighted at NEPCON

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SHENZHEN, China Seica SpA of Strambino, Italy, will showcase upgrades to its Strategy test system with the Strategy VL at NEPCON South China, August 29 through September 1, 2006, in Shenzhen, China. Seica will promote use of its products for high-reliability industries, particularly automotives.

The VL test system fault finder tests new products and repairs boards or assemblies in the field. It performs low-value analog, low- and high-frequency digital, and power analog measurements with a centralized software environment. External instruments may be integrated for expanded test capabilities. An internal architecture and switching matrix are integrated into the basic configuration. The VL uses Seica's VIVA software.



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