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Measurement Platform Configures for Broad Application Range
April 26, 2006 |Estimated reading time: 1 minute
BEAVERTON, Ore. — The flexible M150 device measurement platform from Cascade Microtech measures DC to 220 GHz for 150-mm semiconductor wafers, ICs, PCBs, microelectromechanical systems (MEMS), and bioscience devices on one platform.
Because the M150 can be reconfigured from one design to the next in 20–30 min., the platform will not interrupt workflow, allowing customers to switch applications on the fly. The platform is also compatible with all test-probe types, as well as Cascade's L-Series Microfluidics Metrology Systems for life sciences applications.
The configurability of the M150 platform meets the needs of emerging markets, such as those in Japan where cost is a concern, said Diana Laboy-Rush, product manager, Cascade Microtech, Inc. The company also sees a market in university labs administering R&D on semiconductor devices and processors.
The M150 is said to help alleviate device problems related to power consumption, operating frequency, signal isolation, signal integrity issues on PCBs and high-speed interconnects, and channel bandwidth. Because all components of the system are pre-planarized, it self-calibrates — eliminating the need for user calibration. System precision reaches 25 µm for small pads, while module precision is down to 1 µm.
The platform is available now in two options: an application-specific package for DC, RF, failure analysis, PCB test, or millimeter wave products; or a self-built options in which customers optimize the system according to their specific application.