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Test Solution Handles Multiple Board Designs
April 6, 2006 |Estimated reading time: Less than a minute
STEVENSVILLE, Md. — The JTAG ProVision tool from JTAG Technologies is said to speed and facilitate developing boundary-scan applications based on the IEEE 1149.x standards, enabling engineers to achieve test coverage and in-system programming objectives. JTAG ProVision handles all complexity levels, from single boards with one or more Test Access Ports (TAPs) through complex, multi-board configurations.
An application wizard leads less-skilled engineers through steps to prepare test and in-system programming applications. Graphical tools reportedly ease design data management for boundary-scan applications while keeping design accessibility and test coverage in mind.
JTAG ProVision creates a full set of tests and in-system programming solutions, analyzing boundary-scan and non-boundary-scan design portions automatically. A device modeling approach provides information to control non-scan clusters for full test coverage with manual override capability (for skilled operators/engineers).