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Device Tester Offers Small Footprint
June 24, 2005 |Estimated reading time: Less than a minute
CANTON, Mass. — Designed for testing microelectronic devices, MEMS, photonics and other small components, the 5848 MicroTester from Instron provides precise load and displacement measurement capabilities for semiconductor die shear and pull tests, tensile testing of fine wires and fibers, flex testing of circuit boards and substrates and peel tests of thin films and substrates. Its 2-kN load capacity provides sub-micron position-measurement accuracy and high-precision load and position-control capability required for static- and cyclic-fatigue testing. A rigid frame for use in horizontal and vertical orientations ensures accurate, repeatable deformation measurements. An encoder mounted directly on the loading actuator is said to provide >20-nm position-measurement resolution. The tester also features a servo-electric actuator-drive system suitable for cleanroom environments, and a small footprint for installing the tester on laboratory workbenches or tables.