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Digitaltest to Focus on Strategic Manufacturing at Nepcon Shanghai
January 26, 2005 |Estimated reading time: 1 minute
STUTENSEE, Germany — Digitaltest GmbH will present a clear vision to electronics manufacturers for maximizing return on test investment at the Nepcon Shanghai show, to be held April 12-15, 2005. Digitaltest offers a methodology that is designed for concurrent testing for all its MTS series systems, enabling electronics OEMs, contract manufacturers, and their partners to accelerate products-to-market, while reducing test costs and improving product quality by optimizing test strategies early in the production cycle.
Two of Digitaltest's in-circuit testers that will be displayed at Nepcon Shanghai are as follows:
MTS180 in-circuit tester is Digitaltest's economical solution for high-volume production. Equipped with a press-down unit and a combination of analog and hybrid in-circuit test pins, it can also be equipped with functional test modules to provide higher fault coverage.Users can create complex fixtures with features such as double-sided board access and OpensCheck probes from both sides. Additionally, up to 2000 analog or 1600 hybrid pins may be added, providing a reasonably sized platform.
MTS300 SIGMA in-circuit tester can be optimally configured for current needs without limiting the possibilities of future expansion. Future changes to individual test methods, as well as to the number of tester pins, can be performed. The system is designed for high throughput, with up to 1,000 measurements per second. It provides analog and digital in-circuit test capabilities, vectorless testing, functional test, boundary scan, and on-board programming. In addition, it can be integrated into a handling system, offering enough space for the tester rack, plus additional space for IEEE or VXI instruments. The press system, driven by a servomotor, allows double-sided fixturing and dual level for both ICT and functional test. Short wire connections guarantee signal integrity and quality.