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New Tester Shortens Time-to-test
January 10, 2005 |Estimated reading time: Less than a minute
ST.-BLANKENLOCH, Germany — MTS888 Omega high-pin-count, high-performance tester from Digitaltest GmbH, to be shown at booth #2469 at APEX, IPC Printed Circuits Expo and the Designers Summit, February 22-24, 2005, in Anaheim, Calif., provides up to 7040 analog test pins or up to 3456 hybrid test pins. By providing a non-multiplexed (1:1) pin structure with a logic family definition for each pin, the MTS888 eliminates the need to generate a test program prior to fixture design.
The new tester's architecture allows the fixture build to start before the final test program is developed, shortening the time-to-test by two to three weeks in most cases. Deep serial memory of up to 256k behind the driver/sensor, plus the use of intelligent data compression algorithm, allows each pin to perform on-board programming and Boundary Scan individually.