Reading time ( words)
Boston and San Jose, Calif. — Teradyne Inc. announces that Xilinx has purchased multiple FLEX test systems for next-generation FPGA device test.
Xilinx programmable logic devices are used in a wide array of applications ranging from wireless base stations to DVD players. Xilinx selected FLEX for functional digital test at 200+ MHz, very deep scan and 1GHz clocking capability. Built on a Universal Slot, "Tester-per-device-core" architecture, FLEX is said to provide Xilinx twice the throughput of previous device test solutions.
Xilinx is the leading supplier of complete programmable logic solutions, including advanced integrated circuits, software design tools, predefined system functions delivered as cores and field engineering support.
Teradyne is the world's largest supplier of automatic test equipment, and a leading supplier of interconnection systems. For more information, visit www.teradyne.com.