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Photon Dynamics to Present at NEPCON West
November 18, 2002 |Estimated reading time: Less than a minute
Aliso Viejo, Calif. -- Photon Dynamics Inc. will present at NEPCON West. The forum will address advanced yield management techniques for integrated automatic optical and X-ray inspection (AOXI) solutions.
Lloyd Jones, senior optical physicist, Electronics Division, Photon Dynamics, will present, "Combination AOI/AXI Systems -- A Powerful Solution for PWA Inspection," on December 4, 2002, in San Jose, Calif. Jones will review the defect-detection applications of AOI and AXI, the benefits of AOXI in the assembly line process, and the relative merits and drawbacks of alternative inspection techniques.
Photon Dynamics Inc. is a leading global supplier of integrated yield management solutions for the display, electronics and glass markets. For more information, visit www.photondynamics.com.