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BOM: The Path to Managing Parts
09/24/2021 | Nolan Johnson, I-Connect007
Siemens Global Webinar: Data-Driven Manufacturing in the Electronics Industry
09/22/2021 | Pete Starkey, I-Connect007
BOMs and the Supply Chain from an Assembler's Point of View
09/22/2021 | Nolan Johnson, I-Connect007
A Multi-Tenant PLM Software Solution
09/20/2021 | Nolan Johnson, I-Connect007
Review: Emerging Opportunities for Additive Electronics
09/15/2021 | Pete Starkey, I-Connect007
SMT :: Standards
Process Ionic Contamination Test (PICT) Standard Roundtable With Industry Experts
With standards committees set to release the first of four new test standards, industry experts discussed the process ionic contamination test (PICT) standard, which was recently approved by the IEC for publication. Roundtable participants included Teresa Rowe, senior director of assembly and standards technology at IPC, Graham Naisbitt, chairman and CEO of Gen3, Jason Keeping, corporate process development at Celestica, and Doug Pauls, principal materials and process engineer at Collins Aerospace.
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