Lost your password?
Not a member?
Resend confirmation instructions
Sort By Category
- New Technology
- New Products
- Test & Inspection
- Breaking News
- IPC Standards
- Rework & Repair
- From The Show
- Market Impact
Tech 2 Tech: KYZEN’s Short Technical Sessions a Big Hit
01/20/2021 | Nolan Johnson, I-Connect007
2021: The Year of X = Xc – 1
01/08/2021 | Nolan Johnson, I-Connect007
Meet Cooler Cao: SMT007 Columnist
01/06/2021 | I-Connect007 Editorial Team
This Month in SMT007 Magazine: The Skilled Worker
01/05/2021 | Leo Lambert, EPTAC
Tales from a Trailblazer: An Interview with Christine Davis
01/05/2021 | Steve Williams, The Right Approach Consulting LLC
SMT :: Standards
Process Ionic Contamination Test (PICT) Standard Roundtable With Industry Experts
With standards committees set to release the first of four new test standards, industry experts discussed the process ionic contamination test (PICT) standard, which was recently approved by the IEC for publication. Roundtable participants included Teresa Rowe, senior director of assembly and standards technology at IPC, Graham Naisbitt, chairman and CEO of Gen3, Jason Keeping, corporate process development at Celestica, and Doug Pauls, principal materials and process engineer at Collins Aerospace.
Copyright © 2021 I-Connect007. All rights reserved.