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Integrated Micro-Electronics Inc. (IMI), one of the leading worldwide providers of electronics manufacturing services (EMS), has announced that Christopher Evan Mariano and Gilbert Peren of IMI’s Test and Systems Development (TSD) group won the Best Paper in Electronics and Semiconductors category in the 2016 National Instruments (NI) ASEAN/Australia & New Zealand (ANZ) Engineering Impact Awards.
The winning paper, “Accelerating Development of Dynamic and Static Testers for High Voltage IGBT Power Modules using LabVIEW and NI PXI,” showcased the test innovations made by the TSD group for a major power module customer of IMI. The group developed a custom test platform to accurately and reliably test the performance of 1700 volts/600 amperes power modules and effectively control the effects of stray inductance and other challenges related to high voltage testing in kilovolt range.
National Instruments hosts the annual competition, recognizing innovations that make use of their test platforms and products. NI is an American multinational company that produces automated test equipment and visual instrumentation software.
IMI TSD is an NI Alliance Partner, offering and developing custom test solutions for EMS customers using NI platforms and products.