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JTAG Technologies return to SMTA this year to premiere several new hardware products for PCB testing and in-system (device) programming and to showcase their new collaborative product with Altium - JTAG Maps plus various functional tester products.
The highlights from JTAG Technologies at the Rosemont, IL event this year:
JTAG Inside – Symphony Series
The innovative production-oriented solutions on display will include JTAG’s extensive Symphony range of 3rd party tester integration products. Use of the Symphony options allows the very latest professional JTAG/boundary-scan capabilities to be added to existing ATE from Teradyne, Keysight, SPEA, Seica, NI and others. JTAG will show you this portfolio in details at the electronic event.
JT 5705/FXT Multi-Function Tester
The latest product on display will be an example of JTAG’s ‘fixture embedded’ test technology - the JT 5705/FXT multi-function JTAG tester built into one the small linear series of cassette-based re-configurable fixtures of Everett Charles Technologies (ECT), a world-renowned name in PCB test fixtures and interface.
The JT 5705/FXT is a compact, single-board test system that supports analog measurement and stimulus, frequency measurements, digital I/O, boundary-scan testing and also in-system device programming. Within the fixture multiple JT 5705/FXT tester cards can be mounted on purpose-built carriers featuring the ATE industry standard ‘Pylon’ connectors, making test system build a snap.
JTAG-powered PCB tester-programmer the JT 57xx/RMI ‘Combi-System’
A modular concept of a newly designed base-level 19” U rack-mount chassis assembly that can house up to four customer-specified modules offering various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement features. The modules are either ½ rack or ¼ rack width and are available in different configurations. JTAG will present you the full module range at the show.
Introduction to JTAG Maps – A simple extension to Altium Designer Tool suite
A large number of today's electronic designs feature JTAG/boundary-scan components that provide valuable test resources during hardware debug, manufacturing test and even depot repair. JTAG Maps is a simple extension to the Altium Designer tool suite that allows the user/engineer to thoroughly assess the capabilities of the JTAG/boundary-scan resources on their design - before committing to layout. Until now engineers could often spend hours highlighting the boundary-scan nets of a design manually to assess the fault coverage that boundary-scan testing could bring a specific design. Today the free JTAG Maps for Altium, application extension, does all this and more, freeing up valuable time, allowing a more thorough DfT and speeding time to market.
About JTAG Technologies
JTAG Technologies is a market leader and technology innovator of boundary-scan software and hardware products and services. The company was the first to bring to the market such important advances as automated test generation, automated fault coverage analysis, automated flash and PLD programming via boundary-scan, and visualized boundary-scan analysis. Its customers include world leaders in electronics design and manufacturing such as Ericsson, Flextronics, Honeywell, Medtronic, Motorola, Nokia, Philips, Raytheon, Rockwell-Collins, Samsung, and Sony. Its innovative boundary-scan products provide test preparation, test execution, test result analysis and in-system programming applications. With an installed base of over 8000 systems worldwide, JTAG Technologies serves the communications, medical electronics, avionics, defence, automotive, and consumer industries with offices throughout North America, Europe and Asia. JTAG Technologies headquarters are located in Eindhoven, The Netherlands. For more information please click here.