High Speed Via Reliability Testing Using Updated HATS² Technology


Reading time ( words)

Highly Accelerated Thermal Shock (HATS™) High Speed Via Reliability test systems have now been updated with HATS²™ Technology. These updates provide HATS™ test systems with a wider temperature range (-55°C to 265°C), an improved measurement subsystem capable of high-current, micro-ohm precision, 4-wire resistance measurements and the ability to perform Multiple Cycle Convection Oven Reflow Simulation with in-situ resistance measurements in accordance with IPC-TM-650 Method 2.6.27B. This update also allows HATS™ test systems to test up to 72 IPC-2221B Type "D" coupons and 36 Traditional HATS™ or new HATS²™ Single Via coupons for both Multiple Cycle Convection Oven Reflow Simulation and Thermal Shock/Cycling.

The patented HATS²™ Single Via Test Coupon contains 7 Single Via Nets. Each of these Single Via Nets can be replaced by a daisy-chain net. This allows an updated HATS™ unit to collect electrical resistance data from both Single Via and Daisy-chain test nets for the via structures on the coupons.

According to Bob Neves, Microtek Laboratories China CTO/chairman, “Designers can include 1 or 2 daisy-chain nets along with 5-6 single via nets on the same HATS²™ Single Via Test Coupon. This should provide a bridge between traditional daisy-chain and single via net test results.”

For more information about HATS² Technology or the patented* HATS²™ Single Via Test Coupon, please visit HATS-Tester.com.

Share

Print


Suggested Items

IPC APEX EXPO 2020 Attendees Speak: Lance Davies

02/26/2020 | I-Connect007 Editorial Team
"Test engineers are always being pressed to be agile and reduce costs all the time," said Lance Davies, director of sales for Acroname. "It’s a challenge that they face every single day. They’re getting compressed in the amount of time that they have to develop a test fundamentally."

The Long Road to a New Standard

09/17/2019 | Barry Matties, I-Connect007
Graham Naisbitt, chairman and CEO of Gen3 Systems, has spent decades leading cleanliness testing standards in a number of different standards organizations like IPC, IEC, and ISO around an assortment of testing methods, such as CAF, SIR, and even introducing a new standard this year for his own testing method—process ionic contamination testing (PICT). Naisbitt breaks down his long involvement with standards and where they stand currently.

The Four Things You Need to Know About Test

07/24/2019 | Neil Sharp, JJS Manufacturing
The electronics manufacturing process can often be extremely complex, and the costs associated with product recalls can be astronomical. A robust approach to test is key to ensuring the quality of your product and the satisfaction of your end user.



Copyright © 2020 I-Connect007. All rights reserved.