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Inspection System Debuts via Satellite
June 7, 2007 |Estimated reading time: 1 minute
ANDOVER, Mass. To debut the ×6000 automated X-ray inspection (AXI) system to the Americas market, Agilent Technologies used a live "satellite-feed presentation" to address audiences gathered in Andover, Mass.; Santa Clara, Clara.; and online. Presenters Stig Oresjo and Kathy Adelson, with host Stacy Johnson, discussed effective strategies for test-and-inspection, board complexity, and features of the Medalist ×6000.
Oresjo outlined a 1999 data survey Agilent conducted to determine the defects per million opportunities (DPMO) and actual defect rates of real customer boards, then reviewed Agilent's 2007 study, noting that defect rates are lower with modern, higher-complexity boards, but that actual defects 327 for 3.7 billion solder joints are still significant. Since only 25% of defects are systematic, and roughly 75% are random, said Oresjo, manufacturers need to implement effective test-and-inspection schemes to contain defects and prevent defective assemblies from reaching end customers. Without 3-D AXI, he noted, about 50% of defects would ship from the facility, an unacceptable percentage for medium- to high-complexity assemblies that equal higher-cost, lower-volume end products; 3-D AXI covers about 90% of defects, but no inspection scheme provides 100% coverage, and AOI should be used in combination with AXI.
Adelson, an application engineer, reviewed major improvements made to AXI inspection with the ×6000 model. Throughput is increased from 2× for smaller, less-complex boards to about 3× for larger, more complex assemblies. For example, Adelson inspected a customer board in the ×6000 during the presentation; the test would have taken about four and a half minutes in Agilent's previous-generation 5DX system, but took just over one minute in the ×6000. A 20% increase in machine up-time over prior models combined with this increase in throughput helps lower test costs, Adelson explained. More features on the ×6000 are automated, and adjustments are made in user-intuitive methods. Adelson reviewed specific elements of the system that enhanced defect coverage, time-to-market, and lowered cost of inspection. More details from the Medalist ×6000 product debut will appear in our June 13 SMT Review e-newsletter.
After presentations, attendees at the Santa Clara, Andover, and online feeds were able to ask specific questions related to the machine's new capabilities and features. Peter Esbensen, R&D engineer, then reviewed the system's updated software for attendees at the Andover facility, while Santa Clara attendees received a similar presentation. Online attendees were urged to contact local Agilent representatives for demos. To learn more about Agilent's satellite-feed debut, visit the Medalist Website.