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IPC Honors Members, Company at IPCWorks '05
October 25, 2005 |Estimated reading time: 2 minutes
BANNOCKBURN, Ill. — IPC–Association Connecting Electronics Industries is honoring 28 individuals and one company at IPCWorks 2005, currently happening from October 24 in Las Vegas, for their contributions to IPC and the electronics interconnect industry.A Special Recognition Award was presented to Motorola Inc. for the company's global industry leadership in embedded passives and promoting and educating the industry on emerging technologies. Stephen Gregory of LaBarge Inc. was also presented with a Special Recognition Award for his support of the IPC TechNet e-mail forum.IPC also presented 27 Distinguished Committee Service Awards. This award is given to IPC committee members who have made an exceptional contribution to a specific standard, guideline, round-robin test program or other IPC program.
Individual Awards: Doug Furbush, Georgia Tech, for his leadership in the development of IPC-2577, Sectional Requirements for Supply Chain Communications of Manufacturing Quality Assessment — Product Date eXchange.
Teresa Rowe, AAI Corporation, for her leadership in the development of J-STD-001, Change Comparison Handbook.
Dennis Fritz, MacDermid Inc., for his contributions in forming and leading the IPC Embedded Passives Users Group.
Sue Spath, Solectron, for her support in the development of IPC-A-610D and J-STD-001D, Training and Certification programs.
Team Awards:The following individuals were recognized for their contributions to the development of IPC-A-610, Change Comparison Handbook — Blen Talbot, L3 Communications; Sharon Ventress, U.S. Army Aviation & Missile Command; Karen Moffitt, Moffitt Consulting Services; and Leo Lambert, Eptac Corporation.
For their leadership in the development of IPC-4553, Specification for Immersion Silver Plating for Printed Circuit Boards, the following were presented with an award: George Milad, UIC/Uyemura International Corp.; and Gerard O'Brien, Photocircuits Corporation.
IPC also honored an additional 12 volunteers for their contributions to the development of IPC-4553 — Karl Wengenroth, Enthone Inc. – Cookson Electronics; Richard Prendergast, Enthone Inc. – Cookson Electronics; Richard Edgar, Tec-Line Incorporated; Frank Ferrandino, Matrix Metrologies, Inc.; Donald Gudeczauskas, UIC/Uyemura International Corp.; Trevor Bowers, Adtran Inc.; David Hillman, Rockwell Collins; Kuldip Johal, Atotech USA Inc.; Ramesh Mohabir, Celestica International Inc.; Gail Auyeung, Celestica International; Karl Sauter, Sun Microsystems; and Donald Cullen, MacDermid Inc.
For their leadership in the development of IPC-9691, Users Guide for the IPC-TM-650, Method 2.6.25, Conductive Anodic Filament (CAF) Resistance Test, the following two committee chairs were honored: Dr. Beverley Christian, Research in Motion Limited; and Karl Sauter, Sun Microsystems.
For their contributions to the development of IPC-9691, three volunteers earned accolades: Dr. Christopher Hunt, National Physical Laboratory, U.K.; Alan Brewin, National Physical Laboratory, U.K.; and Ling Zou, National Physical Laboratory, U.K.
For more information on the awards and award recipients, please contact Sandy Gentry, IPC's media relations manager, at (847) 597-2871 or SandyGentry@ipc.org.