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Surface Copper Probe Enhances Benchtop Coating System
August 19, 2005 |Estimated reading time: Less than a minute
ELK GROVE VILLAGE, Ill. — Oxford Instruments Coating Measurement (OICM)'s SRP-4 surface copper probe integrates with the CMI701M benchtop system, reportedly adding functionality and cost savings to the CMI701M's coating thickness measurement performance. The SRP-4 features replaceable, interchangeable tips, eliminating the expense of replacement probes, and allowing for quick adjustment for new measurement applications. The small-footprint probe features a flexible rugged cable, and is designed for less downtime and longer life. Together, the SRP-4 probe and CMI701M system accurately measure bare foil material, as well as copper foil on rigid, flexible, single- and double-sided or multi-layer boards for PCB manufacturers and buyers, and suppliers of copper foil and PCB base materials. Additional probes are also available to enhance the CMI701M's functionality for additional applications, including the measurement of plated thru-hole copper before and after etch.