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Teradyne Expands Support for STIL Format, Strengthening Design-to-Test Linkage
November 25, 2002 |Estimated reading time: 1 minute
Boston and Israel -- Teradyne Inc.'s Wave Wizard, its standard tool for test program generation provided by partner Test Insight, will support the Standard Test Interface Language (STIL -- IEEE 1450) for Teradyne tester platforms.
Wave Wizard enables test engineers to quickly create Teradyne ATE test programs from test patterns generated by EDA software design tools. The addition of STIL support enhances this capability by allowing STIL format patterns produced by advanced DFT tools to be read directly into the Wave Wizard tool, then incorporated into Teradyne tester programs. Interest in generating DFT tests in the STIL format is increasing due to STIL"s flexibility, efficiency and facilitation of failure diagnostics and core-based testing.
The new Wave Wizard capability is available immediately and supports Teradyne's Integra and Catalyst series test systems, including Integra FLEX, Tiger, Catalyst and the Integra J750. The STIL capability of Wave Wizard has been specifically designed for Teradyne"s platforms to produce optimized scan test files.
Test Insight Ltd. puts years of test engineering experience into innovative software tools that provide better integration between device design and test. For more information, visit www.testinsight.com.
Teradyne is the world's largest supplier of automatic test equipment and is also a leading supplier of high performance interconnection systems. For more information, visit www.teradyne.com.