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December 31, 1969 |Estimated reading time: 1 minute
August 31-September 3, 2001 - Featuring Test Equipment
Test Bench Generator
The BSDL Testwriter automatic test bench generator is the first member of a family of EDA tools for Boundary Scan/IEEE1149.1. Now the existing spectrum of hardware and software products for the in-system programming (ISP) and the hierarchic test via Boundary Scan is completed by corresponding tools to design and test chips. The Testwriter sets completely new standards in making possible a fully automatic generation of the test bench required for verification of Boundary Scan structures. Not only is a complete test range guaranteed and error sources excluded, the whole verification process' efficiency is improved. GOEPEL electronic, Jena, Germany. www.goepel.com.
Test and Taping Machine
The MP-PLUNGE tube or bulk to test and tape machine is suited for mid-volume input from tube or bulk to tape applications requiring plunge to board test capability. The MP-PLUNGE achieves throughputs of up to 3,600 pph, and its integrated processes include vision inspection, electrical test, and taping with optional laser mark capabilities. The machine is RF compatible and interfaces with most standard testers. Rejected parts are automatically sorted and placed into three to five output bins. Ismeca USA Inc., Vista, Calif. www.ismeca.com.
Memory Test System
The FLASH 750 MicroCOSM memory test system extends the FLASH 750 memory test system platform. The system reduces semiconductor manufacturers' time and cost to ramp into high-volume manufacturing by enabling the development and debug of test programs, DIBs and probe cards without impacting current production. The MicroCOSM has the same 100 MHz electronics interface correlation and IG-XL software as the high-parallel FLASH 750 production system. This compatibility between systems enables the transfer of test programs into production in the least amount of time. Teradyne Inc., San Jose, Calif. www.teradyne.com.
Mixed-Signal Tester
The Quartet One mixed-signal test system, a mixed-signal tester with digital signal processing (DSP)-per-pin technology, has three significant new options. These options include the high throughput capture processor (HTCP), the Arbitrary Analog Signal Generator and FAST SCAN. These new options allow the Quartet One to address the emerging requirements of next-generation audio, video and LAN technologies, including 24-bit audio and gigabyte LAN test applications. In addition, the options increase the Quartet One's usability by broadening its mass storage and datacom device testing applications. Credence Systems Corp., Fremont, Calif. www.credence.com.