Reading time ( words)
ViTrox Technologies held a successful User Group Meeting (UGM) at Evotest, Inc. in San Jose, Calif. More than 20 customers participated in this event.
The event was well accepted and supported by all customers in attendance. Chong Wei Chin, R&D Assistant Manager and Tan Piet Gek, Senior Technical Support Engineer, presented ViTrox’s AOI and AXI inspection solutions.
The main purpose of the event was to share ViTrox’s latest AOI and AXI features and capabilities with customers. Additionally, customers learned about the latest trends in X-ray that can help with their inspection needs. Customers were able to experience the reliability, ease of programing and also to maximize the capabilities of the machines to help them in capturing production problems.
Numerous positive feedback was gathered from customers who participated in the UGM. George Te, Test Engineer from Jabil Inc. said, “The format of the meeting was well done. It is nice to hear about future enhancements for current issues.” Thang Nguyen, Test Engineer from Paramit Corp. added, “We want to have yearly UGM like this.”
ViTrox prepared welcome gifts for each participant and the grand prize for the drawing was an iPad Mini. The next ViTrox UGM will be held in Brazil in July. For more information about ViTrox, visit www.vitrox.com.