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The access to nodes of assemblies with ever increasing complexity is getting more and more difficult, resulting in reduced fault coverage. To help address this issue, JTAG Technologies will be showcasing its latest technologies at the upcoming IPC APEX Expo 2016 conference and exhibition.
In its booth, JTAG will display the following highlights from its comprehensive ATE product portfolio:
- ICT, MDA or flying probe systems that are quickly and easily upgraded with JTAG Technologies' boundary-scan solutions.
- Traditional functional tests based on National Instruments' LabView/TestStand, C++, .net and other programming languages often feature complex and time-consuming test programs. Easy access to your assembly via boundary-scan pins can simplify your existing test programs and ease diagnosis in case of faults.
Peter van den Eijnden, managing director of JTAG Technologies, said: "Since many years, we are cooperating with renowned ATE suppliers to make sure that our customers will continue to enjoy optimal use of their existing ICT/MDA/FPT/FCT systems throughout the coming years. In joint efforts with various test system manufacturers we developed special hardware and software solutions. These special solutions enable perfect integration of our tools into these test systems, so users benefit from advantages of the combination of both methods."
JTAG Technologies is also showcasing the latest in its highly regarded range of boundary-scan controller hardware for PCB assembly and system testing–the JT 5705 series, which incorporates both JTAG/boundary-scan controller functions and mixed-signal I/O channels. Extensive input protection is provided to ensure high levels of in-service reliability and low maintenance. Connection to the tester is via a USB interface.
- The first in the series - JT 5705/USB - is supplied as desk-top instrument, primarily aimed at hardware validation applications in design, small-scale production test and in some cases field service and repair.